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Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs

dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T18:46:19Z
dc.date.available2021-10-22T18:46:19Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25111
dc.sourceIIOimport
dc.titleLow frequency nosie spectroscopy in rotated UTBOX nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceInternational Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate1/06/2015
dc.source.conferencelocationXi'an China
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7288588
imec.availabilityPublished - imec


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