Causes and consequences of the stochastic aspect of filamentary RRAM

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Author(s)

Degraeve, Robin

;

Fantini, Andrea

;

Raghavan, Nagarajan

;

;

;

Govoreanu, Bogdan

;

Belmonte, Attilio

;

Linten, Dimitri

;

Journal

Microelectronic Engineering

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1993 since deposited on 2021-10-22

Acq. date: 2025-10-28