dc.contributor.author | Doxastakis, Manolis | |
dc.contributor.author | Suh, Hyo Seon | |
dc.contributor.author | Chen, Xuanxuan | |
dc.contributor.author | Rincon Delgadillo, Paulina | |
dc.contributor.author | Wan, Lingshu | |
dc.contributor.author | Williamson, Lance | |
dc.contributor.author | Jiang, Zhang | |
dc.contributor.author | Strzalka, Joseph | |
dc.contributor.author | Wang, Jin | |
dc.contributor.author | Chen, Wei | |
dc.contributor.author | Ferrier, Nicola | |
dc.contributor.author | Ramirez-Hernandez, Abelardo | |
dc.contributor.author | de Pablo, Juan | |
dc.contributor.author | Gronheid, Roel | |
dc.contributor.author | Nealey, Paul | |
dc.date.accessioned | 2021-10-22T19:05:35Z | |
dc.date.available | 2021-10-22T19:05:35Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25224 | |
dc.source | IIOimport | |
dc.title | Grazing-incidence small angle x-ray scattering studies of nanoscale polymer gratings | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Suh, Hyo Seon | |
dc.contributor.imecauthor | Rincon Delgadillo, Paulina | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.source.peerreview | yes | |
dc.source.beginpage | 94241N | |
dc.source.conference | Metrology, Inspection, and Process Control for Microlithography XXIX | |
dc.source.conferencedate | 22/02/2015 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2210992 | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 9424 | |