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Structural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices

dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorSmets, Quentin
dc.contributor.authorRooyackers, Rita
dc.contributor.authorGeypen, Jef
dc.contributor.authorVerhulst, Anne
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.authorMerckling, Clement
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T19:10:10Z
dc.date.available2021-10-22T19:10:10Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25247
dc.sourceIIOimport
dc.titleStructural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices
dc.typeProceedings paper
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorGeypen, Jef
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.source.peerreviewyes
dc.source.beginpageWe1AD6.6
dc.source.conferenceCompound Semiconductor Week 2015
dc.source.conferencedate28/06/2015
dc.source.conferencelocationSanta Barbara, CA USA
imec.availabilityPublished - imec


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