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New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBellens, Rudi
dc.contributor.authorOgier, Jean-Luc
dc.contributor.authorDepas, Michel
dc.contributor.authorRoussel, Philippe
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-30T11:47:36Z
dc.date.available2021-09-30T11:47:36Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2525
dc.sourceIIOimport
dc.titleNew insights in the relation between electron trap generation and the statistical properties of oxide breakdown
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorRoussel, Philippe
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage904
dc.source.endpage911
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue4
dc.source.volume45
imec.availabilityPublished - open access


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