Authors

Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Ogier, Jean-Luc; Depas, Michel; Roussel, Philippe; Maes, Herman

Issue

4

Journal

IEEE Trans. Electron Devices

Volume

45

Title

New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

Publication type

Journal article

Embargo date

9999-12-31