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New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
Publication:
New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
Date
1998
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Groeseneken, Guido
;
Bellens, Rudi
;
Ogier, Jean-Luc
;
Depas, Michel
;
Roussel, Philippe
;
Maes, Herman
Journal
IEEE Trans. Electron Devices
Abstract
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2069
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
2069
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations