New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

dc.contributor.author	Degraeve, Robin
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	Bellens, Rudi
dc.contributor.author	Ogier, Jean-Luc
dc.contributor.author	Depas, Michel
dc.contributor.author	Roussel, Philippe
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.imecauthor	Roussel, Philippe
dc.date.accessioned	2021-09-30T11:47:36Z
dc.date.available	2021-09-30T11:47:36Z
dc.date.embargo	9999-12-31
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2525
dc.source.beginpage	904
dc.source.endpage	911
dc.source.issue	4
dc.source.journal	IEEE Trans. Electron Devices
dc.source.volume	45
dc.title	New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
dc.type	Journal article
dspace.entity.type	Publication
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