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Dimensioning for power and performance under 10nm: The limits of FinFETs scaling

dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorJang, Doyoung
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T19:18:30Z
dc.date.available2021-10-22T19:18:30Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25286
dc.sourceIIOimport
dc.titleDimensioning for power and performance under 10nm: The limits of FinFETs scaling
dc.typeProceedings paper
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference2015 International Conference on IC Design & Technology (ICICDT)
dc.source.conferencedate1/06/2015
dc.source.conferencelocationLeuven Belgium
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7165883
imec.availabilityPublished - open access


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