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EXAFS investigation of Sn local environment in strained and relaxed epitaxial Ge1xSnx films

dc.contributor.authorGencarelli, Federica
dc.contributor.authorGrandjean, Didier
dc.contributor.authorShimura, Yosuke
dc.contributor.authorVincent, Benjamin
dc.contributor.authorBanerjee, Dipanjan
dc.contributor.authorVantomme, Andre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorLoo, Roger
dc.contributor.authorHeyns, Marc
dc.contributor.authorTemst, Kristiaan
dc.date.accessioned2021-10-22T19:21:57Z
dc.date.available2021-10-22T19:21:57Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25302
dc.sourceIIOimport
dc.titleEXAFS investigation of Sn local environment in strained and relaxed epitaxial Ge1xSnx films
dc.typeOral presentation
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceSynchrotron and Neutron Workshop - SyNeW
dc.source.conferencedate1/06/2015
dc.source.conferencelocationUtrecht Netherlands
imec.availabilityPublished - imec


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