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On the volatility of oxide defects: activation, deactivation, and transformation

dc.contributor.authorGrasser, Tibor
dc.contributor.authorWaltl, Michael
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorWimmer, Yanick
dc.contributor.authorEl-Sayed, A.-M.
dc.contributor.authorShluger, A.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-22T19:30:14Z
dc.date.available2021-10-22T19:30:14Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25336
dc.sourceIIOimport
dc.titleOn the volatility of oxide defects: activation, deactivation, and transformation
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage5A.3
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate19/04/2015
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112739
imec.availabilityPublished - open access


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