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Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach
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1914 since deposited on 2021-10-22
3last month
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Acq. date: 2026-04-28
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1914 since deposited on 2021-10-22
3last month
1last week
Acq. date: 2026-04-28
Citations