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Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach
Publication:
Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach
Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hoenicke, Philipp
;
Detlefs, Blanka
;
Fleischmann, Claudia
;
Vandervorst, Wilfried
;
Mueller, Matthias
;
Nolot, Emmanuel
;
Grampeix, Helen
;
Beckhoff, Burkhard
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Views
1909
since deposited on 2021-10-22
422
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations