Show simple item record

dc.contributor.authorDerudder, H.
dc.contributor.authorOlyslager, Frank
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-30T11:50:51Z
dc.date.available2021-09-30T11:50:51Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2542
dc.sourceIIOimport
dc.titleDetermination of the TE- and TM-mode reflectivity at a laser facet using perfectly matched layers
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage113
dc.source.endpage116
dc.source.conferenceProceedings 3rd Annual Symposium of the IEEE/LEOS Benelux Chapter
dc.source.conferencedate26/11/1998
dc.source.conferencelocationGent Belgium
imec.availabilityPublished - open access


Files in this item

Thumbnail

This item appears in the following collection(s)

Show simple item record