Determination of the TE- and TM-mode reflectivity at a laser facet using perfectly matched layers
dc.contributor.author | Derudder, H. | |
dc.contributor.author | Olyslager, Frank | |
dc.contributor.author | De Zutter, Daniel | |
dc.date.accessioned | 2021-09-30T11:50:51Z | |
dc.date.available | 2021-09-30T11:50:51Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2542 | |
dc.source | IIOimport | |
dc.title | Determination of the TE- and TM-mode reflectivity at a laser facet using perfectly matched layers | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Zutter, Daniel | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 113 | |
dc.source.endpage | 116 | |
dc.source.conference | Proceedings 3rd Annual Symposium of the IEEE/LEOS Benelux Chapter | |
dc.source.conferencedate | 26/11/1998 | |
dc.source.conferencelocation | Gent Belgium | |
imec.availability | Published - open access |