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ESD characterization of planar InGaAs devices

dc.contributor.authorJi, Zhigang
dc.contributor.authorLinten, Dimitri
dc.contributor.authorBoschke, Roman
dc.contributor.authorHellings, Geert
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorAlian, AliReza
dc.contributor.authorZhou, Daisy
dc.contributor.authorMols, Yves
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorZhang, X.
dc.contributor.authorGao, R.
dc.contributor.authorZhang, J.F.
dc.contributor.authorZhang, W.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T19:55:33Z
dc.date.available2021-10-22T19:55:33Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25431
dc.sourceIIOimport
dc.titleESD characterization of planar InGaAs devices
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorZhou, Daisy
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3f.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate19/04/2015
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112719
imec.availabilityPublished - open access


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