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Origins and implications of increased channel hot carrier variability in nFinFETs

dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorBina, Markus
dc.contributor.authorWimmer, Y.
dc.contributor.authorProcel, L. M.
dc.contributor.authorTrojman, Lionel
dc.contributor.authorCrupi, Felice
dc.contributor.authorPitner, Gregory
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorWeckx, Pieter
dc.contributor.authorBury, Erik
dc.contributor.authorJi, Z.
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T19:59:43Z
dc.date.available2021-10-22T19:59:43Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25445
dc.sourceIIOimport
dc.titleOrigins and implications of increased channel hot carrier variability in nFinFETs
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3B.5
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate19/04/2015
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112706
imec.availabilityPublished - open access


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