dc.contributor.author | Karageorgos, Ioannis | |
dc.contributor.author | Dehaene, Wim | |
dc.contributor.author | Stucchi, Michele | |
dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Ryckaert, Julien | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Baert, Rogier | |
dc.contributor.author | Sakhare, Sushil | |
dc.date.accessioned | 2021-10-22T20:02:46Z | |
dc.date.available | 2021-10-22T20:02:46Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25455 | |
dc.source | IIOimport | |
dc.title | Impact of interconnect multiple-patterning variability on SRAMs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Dehaene, Wim | |
dc.contributor.imecauthor | Stucchi, Michele | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Baert, Rogier | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 609 | |
dc.source.endpage | 612 | |
dc.source.conference | Design, Automation & Test in Europe Conference - DATE | |
dc.source.conferencedate | 9/03/2015 | |
dc.source.conferencelocation | Grenoble France | |
dc.identifier.url | http://www.date-conference.com/proceedings1/2015/html/0932.html | |
imec.availability | Published - imec | |