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DC and noise characteristics of underlap UTBOX SOI nMOSFETs

dc.contributor.authorKudina, Valeriya
dc.contributor.authorGarbar, Nikolai
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T20:15:33Z
dc.date.available2021-10-22T20:15:33Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25496
dc.sourceIIOimport
dc.titleDC and noise characteristics of underlap UTBOX SOI nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage119
dc.source.endpage123
dc.source.conferenceIEEE 35th International Conference on Electronics and Nanotechnology - ELNANO
dc.source.conferencedate21/04/2015
dc.source.conferencelocationXi'an China
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7146849
imec.availabilityPublished - imec


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