dc.contributor.author | Kunnen, Eddy | |
dc.contributor.author | Demuynck, Steven | |
dc.contributor.author | Brouri, Mohand | |
dc.contributor.author | Boemmels, Juergen | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Ryckaert, Julien | |
dc.date.accessioned | 2021-10-22T20:17:21Z | |
dc.date.available | 2021-10-22T20:17:21Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25502 | |
dc.source | IIOimport | |
dc.title | A way to integrate multiple block layers for middle of line contact patterning | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Demuynck, Steven | |
dc.contributor.imecauthor | Boemmels, Juergen | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 94280W | |
dc.source.conference | Advanced Etch Technology for Nanopattering IV | |
dc.source.conferencedate | 22/02/2015 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2209862 | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 9428 | |