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High throughput cell sorter based on lensfree imaging of cells

dc.contributor.authorLagae, Liesbet
dc.contributor.authorVercruysse, Dries
dc.contributor.authorDusa, Alexandra
dc.contributor.authorLiu, Chengxun
dc.contributor.authorde Wijs, Koen
dc.contributor.authorStahl, Richard
dc.contributor.authorVanmeerbeeck, Geert
dc.contributor.authorMajeed, Bivragh
dc.contributor.authorLi, Yi
dc.contributor.authorPeumans, Peter
dc.date.accessioned2021-10-22T20:21:40Z
dc.date.available2021-10-22T20:21:40Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25516
dc.sourceIIOimport
dc.titleHigh throughput cell sorter based on lensfree imaging of cells
dc.typeProceedings paper
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorLiu, Chengxun
dc.contributor.imecauthorde Wijs, Koen
dc.contributor.imecauthorStahl, Richard
dc.contributor.imecauthorVanmeerbeeck, Geert
dc.contributor.imecauthorMajeed, Bivragh
dc.contributor.imecauthorPeumans, Peter
dc.contributor.orcidimecLiu, Chengxun::0000-0002-2104-4657
dc.contributor.orcidimecde Wijs, Koen::0000-0001-7907-3410
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage333
dc.source.endpage336
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2015
dc.source.conferencelocationWashington, D.C. USA
imec.availabilityPublished - open access
imec.internalnotes


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