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Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

dc.contributor.authorLiu, Ziyang
dc.contributor.authorMerckling, Clement
dc.contributor.authorCaymax, Matty
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-22T20:39:17Z
dc.date.available2021-10-22T20:39:17Z
dc.date.issued2015-06
dc.identifier.issn1528-7483
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25570
dc.sourceIIOimport
dc.titleQuantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction
dc.typeJournal article
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3868
dc.source.endpage3874
dc.source.journalCrystal Growth and Design
dc.source.issue8
dc.source.volume15
dc.identifier.urlhttp://pubs.acs.org/doi/abs/10.1021/acs.cgd.5b00489
imec.availabilityPublished - open access


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