Authors

Liu, Ziyang; Merckling, Clement; Caymax, Matty; Rooyackers, Rita; Collaert, Nadine; Thean, Aaron; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc

ISSN

1528-7483

Issue

8

Journal

Crystal Growth and Design

Volume

15

Title

Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

Publication type

Journal article

Embargo date

9999-12-31