Publication:

Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

Date

2015-06

Journal article

Simple item page Full metadata Statistics

Files

31628.pdf 4.06 MB

Author(s)

;

Merckling, Clement

;

;

Rooyackers, Rita

;

Collaert, Nadine

;

;

Richard, Olivier

;

;

Vandervorst, Wilfried

;

Journal

Crystal Growth and Design

Statistics

1899 since deposited on 2021-10-22

Acq. date: 2026-02-25