Publication:

Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

Date

2015-06
Journal article
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dc.contributor.authorLiu, Ziyang
dc.contributor.authorMerckling, Clement
dc.contributor.authorCaymax, Matty
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.accessioned2021-10-22T20:39:17Z
dc.date.available2021-10-22T20:39:17Z
dc.date.embargo9999-12-31
dc.date.issued2015-06
dc.identifier.issn1528-7483
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25570
dc.identifier.urlhttp://pubs.acs.org/doi/abs/10.1021/acs.cgd.5b00489
dc.source.beginpage3868
dc.source.endpage3874
dc.source.issue8
dc.source.journalCrystal Growth and Design
dc.source.volume15
dc.title

Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

dc.typeJournal article
dspace.entity.typePublication
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