dc.contributor.author | Maggioni, Federica | |
dc.contributor.author | Oprins, Herman | |
dc.contributor.author | Milojevic, Dragomir | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Baelmans, Martine | |
dc.date.accessioned | 2021-10-22T20:46:50Z | |
dc.date.available | 2021-10-22T20:46:50Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25592 | |
dc.source | IIOimport | |
dc.title | 3D-convolution based fast transient thermal model for 3D integrated circuits: methodology and applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Oprins, Herman | |
dc.contributor.imecauthor | Milojevic, Dragomir | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | Oprins, Herman::0000-0003-0680-4969 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 107 | |
dc.source.endpage | 112 | |
dc.source.conference | 31st Semiconductor Thermal Measurement and Management Symposium - SEMI-THERM | |
dc.source.conferencedate | 15/03/2015 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - imec | |