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A 3D electrical characterization of single stacking faults in InP by conductive-AFM

dc.contributor.authorMannarino, Manuel
dc.contributor.authorCelano, Umberto
dc.contributor.authorLu, Augustin
dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorParedis, Kristof
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T20:50:47Z
dc.date.available2021-10-22T20:50:47Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25604
dc.sourceIIOimport
dc.titleA 3D electrical characterization of single stacking faults in InP by conductive-AFM
dc.typeMeeting abstract
dc.contributor.imecauthorMannarino, Manuel
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewno
dc.source.beginpageUU8.05
dc.source.conference2015 MRS Fall Meeting symposium UU:
dc.source.conferencedate29/11/2015
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - imec


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