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Automated testing of bare die-to-die stacks

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorWang, Teng
dc.contributor.authorFiedler, Jens
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorStoll, Karsten
dc.date.accessioned2021-10-22T20:54:17Z
dc.date.available2021-10-22T20:54:17Z
dc.date.issued2015-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25614
dc.sourceIIOimport
dc.titleAutomated testing of bare die-to-die stacks
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage10
dc.source.conferenceIEEE International Test Conference - ITC
dc.source.conferencedate6/10/2015
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7342412
imec.availabilityPublished - imec


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