Show simple item record

Automated testing of bare die-to-die stacks

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorWang, Teng
dc.contributor.authorFiedler, Jens
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorStoll, Karsten
dc.date.accessioned2021-10-22T20:54:37Z
dc.date.available2021-10-22T20:54:37Z
dc.date.issued2015-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25615
dc.sourceIIOimport
dc.titleAutomated testing of bare die-to-die stacks
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE European Test Symposium - ETS
dc.source.conferencedate25/05/2015
dc.source.conferencelocationCluj-Napoca Romania
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record