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dc.contributor.authorMartino, M.D.V.
dc.contributor.authorMartino, J.A.
dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T20:58:21Z
dc.date.available2021-10-22T20:58:21Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25625
dc.sourceIIOimport
dc.titleComparison of current mirrors designed with TFET and FinFET devices for different dimensions and temperatures
dc.typeProceedings paper
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage303
dc.source.endpage308
dc.source.conferenceAdvanced CMOS-Compatible Semiconductor Devices 17
dc.source.conferencedate24/05/2015
dc.source.conferencelocationChicago, IL USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/66/5/303.abstract
imec.availabilityPublished - imec
imec.internalnotesECS Proceedings; Vol. 66, Iss. 5


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