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Self-aligned amorphous-IGZO TFTs: Impact of source-drain contacts formation on their negative-bias-illumination-stress (NBIS) instability

dc.contributor.authorNag, Manoj
dc.contributor.authorSteudel, Soeren
dc.contributor.authorSmout, Steve
dc.contributor.authorBhoolokam, Ajay
dc.contributor.authorGenoe, Jan
dc.contributor.authorCobb, Brian
dc.contributor.authorKumar, Abhishek
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-22T21:21:13Z
dc.date.available2021-10-22T21:21:13Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25686
dc.sourceIIOimport
dc.titleSelf-aligned amorphous-IGZO TFTs: Impact of source-drain contacts formation on their negative-bias-illumination-stress (NBIS) instability
dc.typeProceedings paper
dc.contributor.imecauthorNag, Manoj
dc.contributor.imecauthorSmout, Steve
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecSmout, Steve::0000-0001-5464-8951
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewyes
dc.source.beginpage55
dc.source.conferenceSID Symposium Digest of Technical Papers: Proceedings of Eurodisplay
dc.source.conferencedate23/09/2015
dc.source.conferencelocationGhent Belgium
imec.availabilityPublished - imec


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