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A defect-centric perspective on channel hot carrier variability in nMOSFETs

dc.contributor.authorProcel, Luis Miguel
dc.contributor.authorCrupi, Felice
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTrojman, Lionel
dc.contributor.authorKaczer, Ben
dc.contributor.authorWils, N.
dc.contributor.authorTuinhout, H.
dc.date.accessioned2021-10-22T21:55:50Z
dc.date.available2021-10-22T21:55:50Z
dc.date.issued2015
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25774
dc.sourceIIOimport
dc.titleA defect-centric perspective on channel hot carrier variability in nMOSFETs
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage72
dc.source.endpage74
dc.source.journalMicroelectronic Engineering
dc.source.volume147
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0167931715002671
imec.availabilityPublished - imec


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