A defect-centric perspective on channel hot carrier variability in nMOSFETs

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Authors
Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben; Wils, N.; Tuinhout, H.
ISSN
0167-9317
Journal
Microelectronic Engineering
Volume
147
Title
A defect-centric perspective on channel hot carrier variability in nMOSFETs
Publication type
Journal article
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