Publication:
A defect-centric perspective on channel hot carrier variability in nMOSFETs
Date
| dc.contributor.author | Procel, Luis Miguel | |
| dc.contributor.author | Crupi, Felice | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Trojman, Lionel | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Wils, N. | |
| dc.contributor.author | Tuinhout, H. | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-22T21:55:50Z | |
| dc.date.available | 2021-10-22T21:55:50Z | |
| dc.date.issued | 2015 | |
| dc.identifier.issn | 0167-9317 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25774 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0167931715002671 | |
| dc.source.beginpage | 72 | |
| dc.source.endpage | 74 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 147 | |
| dc.title | A defect-centric perspective on channel hot carrier variability in nMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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