Through silicon via to FinFET noise coupling in 3-D integrated circuits

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Authors
Rouhi Najaf Abadi, Alireza; Guo, Wei; Sun, Xiao; Ben Ali, K.; Raskin, J.P; Rack, M.; Roda Neve, Cesar; Choi, M.; Moroz, V.; Van der Plas, Geert; De Wolf, Ingrid; Beyne, Eric; Absil, Philippe
Conference
International Conference on IC Design and Technology - ICICDT
Title
Through silicon via to FinFET noise coupling in 3-D integrated circuits
Publication type
Proceedings paper
Embargo date
9999-12-31
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