Authors

Sakhare, Sushil; Miyaguchi, Kenichi; Raghavan, Praveen; Mercha, Abdelkarim

ISSN

0018-9383

Issue

6

Journal

IEEE Transactions on Electron Devices

Volume

62

Title

Simplistic simulation-based device-VT-targeting technique to determine technology high-density LELE-gate-patterned FinFET SRAM in sub-10 nm era

Publication type

Journal article