At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs

Thumbnail
Metadata
Show full item record
Authors
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan
Conference
IEEE European Test Symposium - ETS
Title
At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs
Publication type
Proceedings paper
Collections