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Noise analysis inadvanced memory devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGiusi, Gino
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T22:53:18Z
dc.date.available2021-10-22T22:53:18Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25908
dc.sourceIIOimport
dc.titleNoise analysis inadvanced memory devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceChina Semiconductor Technology International Conference - CSTIC
dc.source.conferencedate15/03/2015
dc.source.conferencelocationShanghai China
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7153323&contentType=Conference+Publications
imec.availabilityPublished - open access


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