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Implications of inelastic tunneling on the depth of oxide traps in MOSFETs assessed by RTS or BTI
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Authors
Simoen, Eddy
;
Claeys, Cor
;
Fang, Wen
;
Luo, Jun
;
Zhao, Chao
Conference
International Conference on 1/f Noise and Fluctuations - ICNF
Title
Implications of inelastic tunneling on the depth of oxide traps in MOSFETs assessed by RTS or BTI
Publication type
Proceedings paper
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