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A modeling and experimental method for accurate thermal analysis of AlGan/GaN HEMT power-bars

dc.contributor.authorSodan, Vice
dc.contributor.authorStoffels, Steve
dc.contributor.authorOprins, Herman
dc.contributor.authorBaelmans, Martine
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-22T23:03:03Z
dc.date.available2021-10-22T23:03:03Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25929
dc.sourceIIOimport
dc.titleA modeling and experimental method for accurate thermal analysis of AlGan/GaN HEMT power-bars
dc.typeProceedings paper
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorOprins, Herman
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecOprins, Herman::0000-0003-0680-4969
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewyes
dc.source.beginpage377
dc.source.endpage380
dc.source.conferenceIEEE 27th International Symposium on Power Semiconductor Devices and ICs - ISPSD
dc.source.conferencedate10/05/2015
dc.source.conferencelocationHong Kong China
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7123468
imec.availabilityPublished - imec


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