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Evaluation of Sn-based microbumping technology for hybrid IR detectors, 10μm pitch to 5μm pitch

dc.contributor.authorSoussan, Philippe
dc.contributor.authorMajeed, Bivragh
dc.contributor.authorLe Boterf, P.
dc.contributor.authorBouillon, P.
dc.date.accessioned2021-10-22T23:04:22Z
dc.date.available2021-10-22T23:04:22Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25932
dc.sourceIIOimport
dc.titleEvaluation of Sn-based microbumping technology for hybrid IR detectors, 10μm pitch to 5μm pitch
dc.typeProceedings paper
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorMajeed, Bivragh
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecMajeed, Bivragh::0000-0002-1535-4544
dc.source.peerreviewyes
dc.source.beginpage597
dc.source.endpage602
dc.source.conferenceIEEE 65th Electronic Components and Technology Conference - ECTC
dc.source.conferencedate26/05/2015
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7159652
imec.availabilityPublished - imec


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