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Carrier lifetime assessment in integrated Ge waveguide devices

dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVerheyen, Peter
dc.contributor.authorLepage, Guy
dc.contributor.authorAbsil, Philippe
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorVan Thourhout, Dries
dc.date.accessioned2021-10-22T23:06:43Z
dc.date.available2021-10-22T23:06:43Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25937
dc.sourceIIOimport
dc.titleCarrier lifetime assessment in integrated Ge waveguide devices
dc.typeProceedings paper
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorLepage, Guy
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage167
dc.source.endpage168
dc.source.conferenceIEEE 12th International Conference on Group IV Photonics - GPF
dc.source.conferencedate26/08/2015
dc.source.conferencelocationVancouver Canada
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7305916
imec.availabilityPublished - open access


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