Authors

Takakura, Kenichiro; Goto, T.; Yoneoka, M.; Tsunoda, I.; Simoen, Eddy; Claeys, Cor

Conference

28th International Conference on Defects in Semiconductors - ICDS

Title

Radiation hardness of electrical properties of n-channel UTBOX SOI by 2 MeV electron irradiation

Publication type

Oral presentation