Authors

Takakura, Kenichiro; Ogata, H.; Inoue, T.; Yoneoka, M.; Tsunoda, I.; Simoen, Eddy; Claeys, Cor

Conference

28th International Conference on Defects in Semiconductors - ICDS

Title

Investigation of the electrical properties of carbon doped Si0.75Ge0.25/Si hetero junction diodes by 2 MeV electron irradiation

Publication type

Proceedings paper

Embargo date

9999-12-31