Show simple item record

3D-COSTAR: A tool for 2.5D/3D test flow optimization

dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-22T23:27:58Z
dc.date.available2021-10-22T23:27:58Z
dc.date.issued2015-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25983
dc.sourceIIOimport
dc.title3D-COSTAR: A tool for 2.5D/3D test flow optimization
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits - 3D-TEST
dc.source.conferencedate8/10/2015
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://www.itctestweek.org/files/3DTest15Program.pdf
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record