A unified two-band model for oxide traps and interface states in MOS capacitors

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Authors

Taur, Yuan; Chen, Han-Ping; Xie, Qian; Ahn, Jaesoo; McIntyre, Paul; Lin, Dennis; Vais, Abhitosh; Veskler, Dimitri

ISSN

0018-9383

Issue

3

Journal

IEEE Transactions on Electron Devices

Volume

62

Title

A unified two-band model for oxide traps and interface states in MOS capacitors

Publication type

Journal article

Embargo date

9999-12-31

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