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Automated testing of singulated die-to-die stacks

dc.contributor.authorThiele, Frank
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorWang, Teng
dc.contributor.authorFiedler, Jens
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorStoll, Karsten
dc.date.accessioned2021-10-22T23:31:58Z
dc.date.available2021-10-22T23:31:58Z
dc.date.issued2015-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25991
dc.sourceIIOimport
dc.titleAutomated testing of singulated die-to-die stacks
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.conferenceCOMPASS - Cascade Microtech User Meeting
dc.source.conferencedate8/09/2015
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - imec


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