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Challenges probing next generation full array products with 60μm pitch and below

dc.contributor.authorVallauri, Raffaele
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorBroz, Jerry
dc.date.accessioned2021-10-22T23:51:57Z
dc.date.available2021-10-22T23:51:57Z
dc.date.issued2015-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26032
dc.sourceIIOimport
dc.titleChallenges probing next generation full array products with 60μm pitch and below
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE Semiconductor Wafer Test Workshop - SWTW
dc.source.conferencedate7/06/2015
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://www.swtest.org/archive/
imec.availabilityPublished - imec


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