dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Smets, Quentin | |
dc.contributor.author | Verreck, Devin | |
dc.contributor.author | Van de Put, Maarten | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | El Kazzi, Salim | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Soree, Bart | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-23T00:39:20Z | |
dc.date.available | 2021-10-23T00:39:20Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26134 | |
dc.source | IIOimport | |
dc.title | The future of tunnel field-effect transistors | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Smets, Quentin | |
dc.contributor.imecauthor | Verreck, Devin | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Soree, Bart | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Soree, Bart::0000-0002-4157-1956 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | no | |
dc.source.conference | Nanoelectronics Days | |
dc.source.conferencedate | 27/04/2015 | |
dc.source.conferencelocation | Juelich Germany | |
imec.availability | Published - imec | |