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Radiation effects on metal contaminated Si diodes
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Authors
Hakata, T.
;
Ohyama, Hidenori
;
Simoen, Eddy
;
Claeys, C.
;
Sunage, H.
;
Miyahara, K.
Conference
4th International Conference on Electronic Materials - ICEM 98; 24-27 August 1998; Cheju, Korea.
Title
Radiation effects on metal contaminated Si diodes
Publication type
Oral presentation
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