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Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology

dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorChen, Chris
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorChanda, Kaushik
dc.contributor.authorWatt, J.
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-23T00:56:26Z
dc.date.available2021-10-23T00:56:26Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26168
dc.sourceIIOimport
dc.titleCharacterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChen, Chris
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3B.1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate19/04/2015
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112702
imec.availabilityPublished - open access


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