dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Subirats, Alexandre | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Catthoor, Francky | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-23T00:56:59Z | |
dc.date.available | 2021-10-23T00:56:59Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26169 | |
dc.source | IIOimport | |
dc.title | Defect-centric perspective of combined BTI and RTN time-dependent variability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | International Integrated Reliability Workshop - IIRW | |
dc.source.conferencedate | 11/10/2015 | |
dc.source.conferencelocation | Fallen Leaf Lake, CA US | |
imec.availability | Published - open access | |